Test Acuity Solutions (TAS) - Software for corporate test quality and efficiency standards for wafer mapping and the semiconductor industry
We provide software that does
wafer mapping, die grading, single device traceability and
intelligent recall as well as test quality and efficiency
standards for the semiconductor industry
semiconductor, software, die grading, die disposition, wafer, disposition, single device traceability, intelligent recall, technology, wafer mapping, semiconductor wafer
test, test, testing, test data
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