Aystorm Scientific Ltd.
Aystorm Scientific providing surface analysis, materials characterisation and testing(SIMS, SRP, TEM,XPS, Auger)specialising in analysis of thin films,semiconductors, silicon germanium, silicon, shallow junction, gate oxides,II/VI and III/V semiconductor
Surface Analysis, SIMS analysis, Secondary ion mass spectrometry, TOF SIMS analysis, , ule-SIMS analysis SRP, ECVP, VPD-ICPMS, VPD-TXRF, XPS, Auger, DSIMS, uleSIMS, TOFSIMS, RBS, NRA, ERDA, electron microscopy, depth profiling SIMS, high depth resolution SIMS
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