Results for rel:angstec.com
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angstec.com
Spectroscopic ellipsometer, reflectometer and microspectrophotometer for Thin Film thickne
Optical Solutions: spectroscopic ellipsometer, spectroscopic reflectometer and microspectrophotometers for thin film thickness, refractive index, reflection and transmission spectra measurements
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axic.com
Semiconductor Processing Equipment - Plasma Systems - Plasma Treatment - Plasma Cleaning
AXIC, Inc manufactures and distributes semiconductor plasma processing equipment and Thin Film Metrology tools (Ellipsometer, Spectroscopic and Discrete Wavelength Ellipsometry, Film Thickness Probe, Reflectometer) for the semiconductor, III-V compound se
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sciinstruments.com
SCI Instruments
FilmTek™ 2000SE Spectroscopic Ellipsometers. FilmTek™ spectroscopic ellipsometers are based on a rotating compensator design and combine spectroscopic ellipsometry with multi angle reflectometry for accurate film thickness measurement
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Spectroscopic ellipsometer, reflectometer and microspectrophotometer for Thin Film thickne
Optical Solutions: spectroscopic ellipsometer, spectroscopic reflectometer and microspectrophotometers for thin film thickness, refractive index, reflection and transmission spectra measurements
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angstromadvanced.com
Discrete Wavelength Ellipsometer & Spectroscopic Ellipsometer - Home Page - Angstrom Advan
Angstrom Advanced Inc. is a world renown ellipsometer manufacturer, bringing to the market the largest scope of Discrete Wavelength Ellipsometers and Spectroscopic Ellipsometers
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angstronadvanced.com
Discrete Wavelength Ellipsometer & Spectroscopic Ellipsometer - Home Page - Angstrom Advan
Angstrom Advanced Inc. is a world renown ellipsometer manufacturer, bringing to the market the largest scope of Discrete Wavelength Ellipsometers and Spectroscopic Ellipsometers
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angstromadvanced.net
Discrete Wavelength Ellipsometer & Spectroscopic Ellipsometer - Home Page - Angstrom Advan
Angstrom Advanced Inc. is a world renown ellipsometer manufacturer, bringing to the market the largest scope of Discrete Wavelength Ellipsometers and Spectroscopic Ellipsometers
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angstromadvanced.biz
Discrete Wavelength Ellipsometer & Spectroscopic Ellipsometer - Home Page - Angstrom Advan
Angstrom Advanced Inc. is a world renown ellipsometer manufacturer, bringing to the market the largest scope of Discrete Wavelength Ellipsometers and Spectroscopic Ellipsometers
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angstromadvanced.info
Discrete Wavelength Ellipsometer & Spectroscopic Ellipsometer - Home Page - Angstrom Advan
Angstrom Advanced Inc. is a world renown ellipsometer manufacturer, bringing to the market the largest scope of Discrete Wavelength Ellipsometers and Spectroscopic Ellipsometers
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angstronsystems.info
Discrete Wavelength Ellipsometer & Spectroscopic Ellipsometer - Home Page - Angstrom Advan
Angstrom Advanced Inc. is a world renown ellipsometer manufacturer, bringing to the market the largest scope of Discrete Wavelength Ellipsometers and Spectroscopic Ellipsometers
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angstromadvanced.org
Discrete Wavelength Ellipsometer & Spectroscopic Ellipsometer - Home Page - Angstrom Advan
Angstrom Advanced Inc. is a world renown ellipsometer manufacturer, bringing to the market the largest scope of Discrete Wavelength Ellipsometers and Spectroscopic Ellipsometers
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angstromadvanced.us
Discrete Wavelength Ellipsometer & Spectroscopic Ellipsometer - Home Page - Angstrom Advan
Angstrom Advanced Inc. is a world renown ellipsometer manufacturer, bringing to the market the largest scope of Discrete Wavelength Ellipsometers and Spectroscopic Ellipsometers
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angstromadvanced.mobi
Discrete Wavelength Ellipsometer & Spectroscopic Ellipsometer - Home Page - Angstrom Advan
Angstrom Advanced Inc. is a world renown ellipsometer manufacturer, bringing to the market the largest scope of Discrete Wavelength Ellipsometers and Spectroscopic Ellipsometers
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irvase.com
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The IR-VASE is the first and only spectroscopic ellipsometer to cover the spectral range from 2 to 30 microns (333 to 5000 wavenumbers). The IR-VASE can determine both n and k for materials over the entire width of the spectral range.
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jawjapan.com
ジェー・エー・ウーラム・ジャパン - Home
J.A. Woollam develops spectroscopic ellipsometer technology used for thin film and bulk materials characterization. Measures thin film thickness and material optical constants. In-situ and ex-situ, spectral ranges from Vacuum UV to Far IR.
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film-sense.com
Home - Film Sense - Banded Wavelength Ellipsometer
The Film Sense FS-1 Banded Wavelength Ellipsometer realizes many of the benefits of spectroscopic ellipsometry without all the cost and complication.
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Semiconductor Processing Equipment - Plasma Systems - Plasma Treatment - Plasma Cleaning
AXIC, Inc manufactures and distributes semiconductor plasma processing equipment and Thin Film Metrology tools (Ellipsometer, Spectroscopic and Discrete Wavelength Ellipsometry, Film Thickness Probe, Reflectometer) for the semiconductor, III-V compound se
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filmsense.us
Home - Film Sense - Banded Wavelength Ellipsometer
The Film Sense FS-1 Banded Wavelength Ellipsometer realizes many of the benefits of spectroscopic ellipsometry without all the cost and complication.
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sci-soft.com
Home - Scientific Computing International
SCI is a leading innovator and provider of advanced metrology systems and analysis software to major companies in the semiconductor, optoelectronics, data storage, display, MEMS, and optical coating industries.
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jyprocesscontrol.com
In-Situ / In-Line Ellipsometers - HORIBA
In-situ spectroscopic ellipsometers for real-time monitoring and control of thin film deposition and etch processes. Real-time calculation of film thickness, optical constants, and composition of thin film stacks.
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SCI Instruments
FilmTek™ 2000SE Spectroscopic Ellipsometers. FilmTek™ spectroscopic ellipsometers are based on a rotating compensator design and combine spectroscopic ellipsometry with multi angle reflectometry for accurate film thickness measurement
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smartuvisel.com
Spectroscopic Ellipsometers - HORIBA
High performance spectroscopic ellipsometers using non-rotating phase modulation and liquid crystal modulation technologies. Accurate thin film thickness, interface and optical constants characterization. Spectroscopic ellipsometers from VUV to NIR
